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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 4564911 B1

PDFFull Text
Date of Patent:
Jan. 14, 1986

Filed:

Apr. 25, 1983

Method of monitoring a cutting tool by recognizing a sensed deviation in

Applicant:
Inventors:

Stanley K Smith, Fenton, MI (US);

Donald J Rozsi, Fenton, MI (US);

Alvin M Sabroff, Mentor, OH (US);

Assignee:

Eaton Corporation, Cleveland, OH (US);

Attorneys:

Grace; C. H.

Union; M. L.

Primary Examiner:

Jerry Smith

Assistant Examiner:

Charles B Meyer

Int. Cl.
CPC ...
G06F / ; G06G / ; G01M / ;
U.S. Cl.
CPC ...
364474 ; 364475 ; 364577 ; 364551 ; 364185 ; 340679 ; 318569 ; 73104 ;
Abstract

A method of monitoring the performance of a cutting tool which moves relative to a workpiece through a cycle includes the steps of dividing the cycle into a plurality of increments, sensing a function of force applied to the tool during the increments, mathematically smoothing the function of force sensed during the increments, and establishing a trend in the mathematically smoothed function of force for the plurality of increments. The mathematically smoothed function of force is compared with the established trend and if the mathematically smoothed function of force deviates substantially from the established trend a first signal is generated.

Find Patent Forward Citations

Smith, Stanley. (1986). Method of monitoring a cutting tool by recognizing a sensed deviation in (U.S. Patent No. 4564911). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4564911

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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