The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 1986
Filed:
Jun. 22, 1982
Nukem GmbH, Hanau, DE;
Abstract
A method and an instrument for testing materials using the eddy current principle, at different frequencies depending on the output quantity of a coil system, compensation values are generated being typical of interfering factors. These compensation values are subsequently superposed on the output values in order to remove the influence of the interfering factors on the measuring. In this manner with a favorable setting of the working point of an amplifier charged with the output values, an overmodulation is avoided and the dynamic range of the amplifier optimally utilized. Therefore good measuring results can be obtained even if the percentage of the interfering signals as compared to the signal controlling the detecting of defects, is relatively high.