The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 1986

Filed:

Mar. 07, 1983
Applicant:
Inventors:

Tadashi Sato, Mito, JP;

Genji Takahashi, Hitachi, JP;

Yoshiaki Inui, Ibaraki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F / ; H01J / ;
U.S. Cl.
CPC ...
250225 ; 324244 ; 324 96 ; 350375 ; 356 72 ;
Abstract

A current is measured by making use of a rotation of polarization plane in a magnetic field, that is, a Faraday effect. A conductor under measurement is transversely inserted into a center opening of a Faraday effect glass which has at least two total reflection areas on a periphery thereof so that a light directed into the Faraday effect glass is circulated around the conductor and emitted externally. The light emitted from the Faraday effect glass is split into at least two light beams, which are converted to electric signals by photoelectric elements, and A.C. components contained in the electric signals are extracted and compared. The electric signals are corrected based on the comparison result. The present measuring apparatus and method attain high precision current measurement in a stable manner over an extended period.


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