The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 1986
Filed:
Jul. 26, 1984
Masakatsu Hiraoka, Uji, JP;
Kazushi Tsumura, Nagaokakyo, JP;
Kenji Baba, Hitachi, JP;
Shunsuke Nogita, Hitachi, JP;
Shunji Mori, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A system for controlling a process utilizing filamentous microorganisms is disclosed. The amount of the microorganisms in a medium for growing the filamentous microorganisms is measured, and the control factors associated with the growth of the microorganisms in the medium are controlled on the basis of the measurement of the amount of microorganisms. In the process of measuring the amount of microorganisms, an optical image of a specimen of the medium is formed and scanned two-dimensionally to produce a series of brightness signals corresponding to the brightness distribution of the optical image. The level of the brightness signal is used to determine the amount of the microorganisms contained in the medium.