The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 1986
Filed:
Dec. 10, 1980
Applicant:
Inventors:
Assignee:
Tokyo Kogaku Kikai Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
356125 ;
Abstract
A projection type lensmeter in which the target image for measuring the refractive power of a lens is projected on a screen and the projected image is magnified and observed through a magnifying observation optical system including a collimator lens having a focal length f.sub.1 adapted to collimate light projected from the target image, and a projection lens having a focal length f.sub.2 adapted to project light from the target image to the screen. The magnifying observation optical system has an effective diameter .phi. and a magnification m.sub.2. The focal lengths f.sub.1 and f.sub.2, the effective diameter .phi., and the magnification m.sub.2 satisfy the following relations: