The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 1986
Filed:
Mar. 06, 1984
Hitachi, Ltd., Tokyo, JP;
Abstract
An acoustic microscope comprising an acoustic transducer which performs both generation and detection of acoustic wave beams, and a sample holding member which opposes to an acoustic wave transmitting and receiving surface of the transducer, to hold an object sample through an acoustic wave propagating medium and to offer behind the sample a layer of an acoustic impedance unequal to that of the sample, so that the sample holding member is moved in parallel, thereby to detect acoustic waves reflected from front and rear surfaces of the sample and acoustic waves reflected from a surface of the sample holding member without reaching the sample and to measure amplitudes and returning periods of time of the reflected acoustic waves, so as to measure the velocity of sound through the sample of unknown thickness, the acoustic impedance of the sample, etc. from the measured values.