The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 1986

Filed:

Oct. 19, 1982
Applicant:
Inventor:

Tadashi Hanaoka, Tanashi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K / ; F23N / ;
U.S. Cl.
CPC ...
364557 ; 236 / ;
Abstract

A temperature measuring system which includes a CR oscillator circuit and a logarithmic transformation circuit. The CR oscillator circuit employs at least a thermistor as the resistance element for forming a time constant with a capacitor which serves as the capacitance element, the oscillation frequency of the oscillator circuit varying with a change in ambient temperature. The logarithmic transformation circuit subjects the information obtained from the CR oscillator circuit to a logarithmic transformation, whereby said information is logarithmically compressed to provide numerical data approximately dependent upon ambient temperature.


Find Patent Forward Citations

Hanaoka, Tadashi. (1986). Temperature measuring system (U.S. Patent No. 4563748). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4563748

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…