The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 1986

Filed:

Sep. 13, 1983
Applicant:
Inventors:

Yasuchika Mori, Kawasaki, JP;

Takashi Shigemasa, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B / ; G05B / ; G06F / ;
U.S. Cl.
CPC ...
364157 ; 364151 ; 364553 ; 364150 ; 318610 ;
Abstract

A process control apparatus wherein dynamic characteristics of a process are identified in accordance with process inputs and outputs, so as to tune digital PID (Proportional-Integral-Derivative) parameters in accordance with the identified dynamic characteristics. The process is an N-input/output process having an interference between the process inputs and outputs. Each transfer function between a given process input and process output is identified. A transfer function between a set-point signal and the process output is obtained and matched with that of an N-input/output decoupled reference model, to tune the PID parameters.


Find Patent Forward Citations

Mori, Yasuchika. (1986). Multivariable proportional-integral-derivative process control apparatus (U.S. Patent No. 4563734). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4563734

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…