The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 1986
Filed:
Dec. 16, 1983
Applicant:
Inventor:
Masaru Tanaka, Kyoto, JP;
Assignee:
Horiba, Ltd., Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ; H03K / ; H03K / ;
U.S. Cl.
CPC ...
2504581 ; 307353 ; 328151 ;
Abstract
An apparatus for measuring the luminous lifetime samples, which eliminates the deviation of the time axis of each channel of a multichannel TAC, deviations resulting from differences the wiring or the time lag of the elements of each channel of the multichannel TAC constituting a principal part of the apparatus. The apparatus operates by adding a respective variable offset voltage to the output of each channel of the TAC and by regulating the offset voltage in every channel without using any delay element so as to eliminate the time axis deviations of the channels.