The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 1986
Filed:
Dec. 22, 1982
Kohji Tada, Osaka, JP;
Yoshiki Kuhara, Osaka, JP;
Masami Tatsumi, Osaka, JP;
Akihiko Kawakami, Osaka, JP;
Sumitomo Electric Industries, Ltd., Osaka, JP;
Abstract
A voltage and electric field measuring device is disclosed. The device uses light, including a polarizer, an electro-optic crystal consisting of a material having an optical rotatory power, and an analyzer arranged in the stated order in the direction of advancement of applied light, with a quarter-wave plate being disposed between the polarizer and crystal or between the crystal and analyzer. The angle of orientation .psi. of the analyzer, relative to the optical axis of the crystal, is set to the product of .theta. and l, where .theta. represents the optical rotatory power, with respect to the applied light, of the crystal near a point at the center of a range of varying temperatures at the installation environment, and l represents the thickness of the crystal measured in the direction of advancement of light. The specified relation between .psi. and .theta..multidot.l maximizes the temperature stability of the device.