The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 1986

Filed:

Jul. 02, 1984
Applicant:
Inventor:

Masaaki Yamagishi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
350414 ; 350464 ;
Abstract

A microscope objective comprising a first, second, third, fourth, fifth and sixth lens components wherein the first lens component is a positive meniscus lens concave toward the object side, the second lens component comprises a positive lens and has positive refractive power as a whole, the third lens component comprises a positive lens and has positive refractive power as a whole, the fourth lens component is a cemented negative meniscus lens convex toward the object side, the fifth lens component is a cemented negative meniscus lens convex toward the image side, and the sixth lens component is a cemented positive meniscus lens, the microscope objective being arranged that the working distance is very long, the image surface is flat, and aberrations are favorably corrected up to the marginal portion of field.


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