The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 1985
Filed:
Nov. 12, 1982
Anthony J Devaney, Ridgefield, CT (US);
Schlumberger Technology Corporation, New York, NY (US);
Abstract
Diffraction tomography systems and methods are disclosed for the reconstruction of physical properties of two and three-dimensional objects from information collected in one or more diffraction tomographic procedures. A diffraction tomographic system is comprised of a continuous or pulsed source of wave energy, a detecting system for the measurement of the amplitude and/or phase of the scattered field resulting from the wave energy interacting with a two or three-dimensional object, a processing and filtering system for processing and filtering the measured signals according to a filtered backpropagation technique thereby generating arrays which are used to reconstruct the object properties, and a graphics display system for displaying obtained reconstructions. Specific embodiments include ultrasound transmission computed tomography; well-to-well electromagnetic and sonic tomography; subsurface electromagnetic or seismic exploration; and X-ray transmission tomography. The methods and systems apply filtered backpropagation techniques which are generalizations of the filtered backprojection technique of X-ray computed tomography to cases where diffraction of the insonifying beam is taken into consideration.