The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 1985
Filed:
May. 13, 1983
Asao Hayashi, Tokyo, JP;
Kenichi Oinoue, Tokyo, JP;
Masahiro Aoki, Tokyo, JP;
Masatoshi Ida, Tokyo, JP;
Olympus Optical Company Limited, Tokyo, JP;
Abstract
In a camera, a focus condition of an objective lens system is automatically detected in accordance with a combination of two different type detection methods. A light flux emanating from the objective lens system is divided into two light fluxes by means of a prism having a half mirror and a reflecting mirror and a first light flux transmitted through the half mirror is received by a first light receiving element array via a lenticular lens array and a second light flux reflected by the half mirror and reflecting mirror successively is directly received by a second light receiving element array. The lenticular lens array is so arranged that an exit pupil of the objective lens and the first light receiving element array are conjugated with each other and thus divided images of the exit pupil are projected upon respective elements of each pair of adjacent light receiving elements. At first, illumination signals supplied from the first image receiving element array are processed to derive a first evaluation value on the basis of an image lateral shift detection to indicate roughly a focal condition of the objective lens system. After the objective lens system has driven near the best focus position, illumination signals supplied from the first and second light receiving element arrays are processed to derive a second evaluation value on the basis of an image sharpness detection to indicate finely the focal condition of the objective lens system.