The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 1985
Filed:
Dec. 08, 1982
Masahiro Aoki, Tokyo, JP;
Junichi Nakamura, Hachioji, JP;
Masatoshi Ida, Hachioji, JP;
Kenichi Oinoue, Tokyo, JP;
Asao Hayashi, Hachioji, JP;
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Abstract
A method and apparatus for detecting focus conditions of a photographic optical system is disclosed. The invention comprises a member for dividing the wavefront of a light beam from a photographic optical system in an image space thereof, a first light receiving device including two photocell arrays provided in the front and the rear of a surface conjugated to a predetermined focal plane of the optical system, and a second light receiving device including at least one photocell array provided at a surface conjugated to one of the photocell arrays in the first light receiving device. A first signal representing horizontal shift of an optical image is detected based on outputs of at least one photocell array in the second light receiving device and one photocell array in the first light receiving device having a relation conjugated to the photocell array in the second light receiving device. A second signal representing defocused amount of the image is detected based on outputs of two photocell arrays in the first light receiving device thereby detecting focus conditions by the first and the second signals.