The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 1985

Filed:

Feb. 15, 1985
Applicant:
Inventors:

Rochus Hien, Speyer, DE;

Wolfgang Weigel, Dossenheim, DE;

Horst Vierling, Heidelberg, DE;

Assignee:

Eltro GmbH, Heidelberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
250235 ; 250334 ; 250347 ; 350-66 ; 350-691 ;
Abstract

The method and apparatus for scanning for radiated energy employs a scanning mirror (1) pivoting azimuthally about a vertical scanning axis (2) and capable of being pivoted also about a pivotal axis (3) that makes an angle with the scanning axis. The mirror reflects the incident IR energy onto a vertically disposed field composed on n individual IR detector elements (22) having (n-1) spacings of equal magnitude. The horizontal motion of the mirror takes place in customary manner but the pivotal motion is smaller than the individual detector elements and their separations. Therefore, the same thermal image requires several pivotal processes and, hence, also several mutually parallel horizontal scanning motions, resulting in achieving greater resolution of the image.


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