The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 1985
Filed:
May. 14, 1985
Applicant:
Inventors:
Assignee:
Thomson-CSF, Paris, FR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F / ;
U.S. Cl.
CPC ...
250225 ; 250227 ; 324 96 ; 356368 ;
Abstract
The invention relates to a device for measuring a magnetic field, comprising a source of rectilinearly polarized light. A magnetooptical medium is situated in the path of the beam, this medium being followed by a mirror refecting this beam. This medium is a medium of which the intrinsic propagation modes are polarized in right-hand and left-hand directions, and which retains the circular polarization. An element acting as a separator by polarization is situated between the source and the medium, a detector device being coupled to the same.
Papuchon, Michel. (1985). Interferometer device for measurement of magnetic fields and electric (U.S. Patent No. 4560867). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4560867
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