logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 4557386 B1

PDFFull Text
Date of Patent:
Dec. 10, 1985

Filed:

Jun. 27, 1983

System to measure geometric and electromagnetic characteristics of

Applicant:
Inventors:

Bruce S Buckley, San Jose, CA (US);

Edward M Buckley, Milpitas, CA (US);

Roy H Reichwein, San Jose, CA (US);

Assignee:

Cochlea Corporation, San Jose, CA (US);

Attorney:

Shaw; Robert

Primary Examiner:

Randolph A Reese

Assistant Examiner:

Edward M Wacyra

Int. Cl.
CPC ...
B07C / ; G01S / ;
U.S. Cl.
CPC ...
209556 ; 209527 ; 209558 ; 209571 ; 209590 ; 367-8 ; 367 11 ; 367 96 ; 367126 ; 414730 ; 901 15 ; 901 45 ; 901 46 ;
Abstract

A system to measure geometric and electromagnetic characteristics of objects. Wave energy of a single frequency (or very narrow band of frequencies) is directed upon an object which reflects (or otherwise interacts with) the wave energy. The reflected wave energy is sensed by many spatially spaced sensors to provide electric signals whose amplitude and phase components are combined to give a quantity from which geometric and/or electromagnetic characteristics of the object can be ascertained.

Find Patent Forward Citations

Quick Actions:

Buckley, Bruce. (1985). System to measure geometric and electromagnetic characteristics of (U.S. Patent No. 4557386). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4557386

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…