The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 1985
Filed:
Jan. 19, 1984
Applicant:
Inventor:
Frank S Krufka, Mount Joy, PA (US);
Assignee:
RCA Corporation, Princeton, NJ (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358107 ; 358 93 ; 358106 ;
Abstract
A system for measuring the average area of apertures in an opaque member scans a large number of lines across the apertures in orthogonal directions. The width of two apertures are measured to obtain an average width. The lengths of two apertures are measured to obtain an average length. The average width and length are multiplied to obtain an average area. The width and length measurements are not necessarily from the same two apertures within the member.