The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 1985
Filed:
Nov. 25, 1983
Eric R Carlson, Fair Haven, NJ (US);
AT&T Bell Laboratories, Murray Hill, NJ (US);
Abstract
The present invention relates to a measurement system for characterizing device performance comprising a set of generating and measuring instruments which are connected to a controller via a data bus. The instruments provide the necessary bias and RF signals to the device and concurrently measure its performance. Primarily three functions are provided: (a) establishment of a desired input signal by the user or the controller and the monitoring in real time of the device performance, (b) taking of a set of measurements and interpreting the measurements to characterize the device performance, and (c) displaying the measured and interpreted data for immediate study and the recording thereof for subsequent use. The automated capability permits a user to tune a device and simultaneously optimize its parameters.