The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 1985
Filed:
Feb. 16, 1984
Kjell J Wickman, Stockholm, SE;
Klas R Wiklund, Taby, SE;
Pharos AB, Lidingo, SE;
Abstract
An arrangement for measuring dimensions and/or checking the dimensional accuracy of large objects (1), such as car bodies or the like. The arrangement comprises a straight movement path (8) and one or a plurality of transmission units (10) movable along the path. During indication of each checking point which may comprise a bolt head, a suspended measuring rod (2-7) or the like, two measuring light beams are projected onto the point concerned from two different directions. When the light beams are projected, two are predetermined and one a variable of the following components: the distance between the starting positions for the first and the second light beam, the angular position between the first light beam and a line drawn between the starting positions and the angular position between the second light beam and said line. It is first ensured by movement of a transmission unit (10) that one of the light beams with a fixed angular relationship to the movement path impinges on the checking point or on a point at which, according to data for the object, the checking point should lie and subsequently the variable component is altered with a controllable control unit (11) so that the second measuring light beam also impinges on the checking point or on a point at which the checking point should lie according to data for the object.