The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 1985

Filed:

Jan. 06, 1982
Applicant:
Inventors:

Toshiki Yamamoto, Oita, JP;

Yukio Kiriu, Oita, JP;

Akira Tsuneoka, Oita, JP;

Kunikane Sudo, Oita, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B22D / ; B22D / ;
U.S. Cl.
CPC ...
164451 ; 164150 ; 164155 ; 164413 ; 164453 ; 164454 ;
Abstract

The abnormality is detected during a flow thereof through the mold. The detection is achieved by means of at least a pair of upper and lower temperature detecting elements, located along the flow of the casting metal. The abnormality is determined to exist when a temperature inversion, that is T.sub.U .ltoreq.T.sub.L, takes place. The symbols T.sub.U and T.sub.L denote the temperatures measured by the upper and lower temperature detecting elements, respectively, in which a relationship, that is T.sub.U >T.sub.L, stands under a normal casting operation.


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