The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 1985

Filed:

Aug. 31, 1982
Applicant:
Inventors:

Bernard David, Gif sur Yvette, FR;

Michel Pigeon, Bures sur Yvette, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324225 ; 324234 ; 324262 ;
Abstract

The invention relates to a process and to devices for the inspection of the surface of a member by means of an eddy current probe. By scanning the member means of the transducer following a given path, the sampled values of the signal supplied by the transducer are recorded for clearly defined positions of the transducer. By restoring the signals, it is possible to simulate a displacement of the transducer along a different path and/or simulate the displacement of a larger size or different type of transducer. The process may be used in steam generators in nuclear reactors and to the examination of irradiated fuel rods in these reactors.


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