The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 1985

Filed:

Dec. 02, 1983
Applicant:
Inventors:

Mineo Yamauchi, Kawasaki, JP;

Yoshimitu Karahashi, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
3316 / ; 3316 / ;
Abstract

A micrometer wherein two or more spindles are disposed on one and the same axis, a spindle in contact with a workpiece to be measured is made unrotatable and a thimble is reduced in diameter. This micrometer comprising a main body (1, 101), a first spindle (15) threadably coupled to the main body and integrally rotatably connected to the thimble (17) and a second spindle (46, 146) connected to the first spindle (15) through a connecting mechanism (70, 150), the connecting mechanism (70, 150) including a contact member (61, 161) and a bearing (53, 153) for transmitting only the axial movement of the first spindle (15) to the second spindle (46, 146).


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