The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 1985

Filed:

Mar. 17, 1983
Applicant:
Inventors:

Jacques Lewiner, 92210 Saint Cloud, FR;

Georges Charpak, Geneve, FR;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324 711 ; 324 72 ; 324452 ; 324457 ;
Abstract

In order to measure the values of the electrical charges (2) carried by a surface S of a dielectric sheet (1), one uses a device consisting of a first electrode or probe (S) facing the surface S, a second electrode (4) applied against the back surface of this sheet, means (F) to displace laterally the probe with respect to the sheet and means (5) to measure the charges (6) induced on this probe. In addition, by means of acoustical, optical or electrical methods, one subjects the surface S to deformation localized in very small spots p (of an area inferior to the one defining the spatial resolution of the measurement) during very short times and repeatly at frequence high enough and in such a way as to have some overlapping of the spots sequentially deformed.


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