The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 1985

Filed:

Feb. 01, 1983
Applicant:
Inventors:

Thomas G Giallorenzi, Springfield, VA (US);

Sang K Sheem, Richardson, TX (US);

Henry F Taylor, Alexandria, VA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356345 ; 250227 ; 356349 ;
Abstract

A fiber optic interferometric physical sensor. A fiber optical Mach-Zehnder interferometer includes a sensor arm and a reference arm having different optical path lengths. A transducer coupled to the sensor arm modulates the phase of light signals passing therethrough in response to a physical quantity. The interferometer is supplied with an input optical signal which includes light components at two different wavelengths. The detected intensity of the output of the interferometer includes two components, each of which vary in relation to the physical quantity. Each output component is related to one of the two optical input wavelengths. The two output components differ in phase by an amount proportional to the path length difference between the sensor and reference arms and proportional to the wavelength difference between the light components of the input optical signal. The phase difference is adjusted such that the sensitivities of the two output components to the physical quantity are never simultaneously at a minimum. In an alternative embodiment, a single laser having a continuously variable wavelength is used with the interferometer having differing sensor and reference path lengths to achieve maximum sensitivity.


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