The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 1985

Filed:

Oct. 06, 1983
Applicant:
Inventors:

Hideo Sakata, Kawasaki, JP;

Yukiji Yoda, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33 / ; 33503 ;
Abstract

This invention relates to measuring instruments such as a three-dimensional measuring instrument having a device for protecting the surface of a scale provided on a guide rail for moving a measuring element support member. A scale (7) secured to one side surface of one of guide rails provided at opposite side surfaces of a bedplate (1), on which a work (18) to be measured is rested, is covered by a pair of a constant load spring. These constant load springs (8) and (8) are solidly secured at the ends at one side to shock absorbers (20) and (20) provided at the end portions of the guide rail (4) and connected at the ends at the other side to a pair of retractors (27) and (27) provided in a support (10) of a measuring element support member (9), and the constant load springs (8) and (8) can be suitably extended or wound by following movements of the measuring element support member (9), so that adhesion of oil to the surface of the scale (7) and the like can be effectively prevented, thus enabling to secure the stable measuring accuracy.


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