The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 1985

Filed:

Aug. 01, 1984
Applicant:
Inventor:

Jerome E Deis, Kettering, OH (US);

Assignee:

The Warner & Swasey Company, Cleveland, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K / ; H03K / ;
U.S. Cl.
CPC ...
377 17 ; 33556 ; 33503 ; 364561 ; 377 44 ;
Abstract

A method of making measurements on a machine having a movable probe for measuring a part in which a present location of the probe is maintained and a past location (e.g., a part measurement) of the probe is also maintained (stored) and advantageously displayed. The measuring apparatus includes two sets of storage members, with the present position information of the probe stored in one set. The present probe position information is transferred to the other storage members in response to a control signal. The control signal, such as an electrical signal indicating contact with an object, causes measurements to be transferred from the one set of storage members to the second set of storage members and, advantageously, the transfer of further information to the second storage members may be locked out of a predetermined time or until an event occurs (such as a resetting signal). The first set of storage members continue to maintain present position information on the probe which may be moving, while an output device (display, etc.) is coupled to the second set of storage members and is not affected by the change in the first set of storage members. The present invention has application of multi-dimension measuring (e.g., coordinate measuring machines) and single dimension measuring (e.g., height gages).


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