The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 1985
Filed:
Dec. 27, 1982
Katsuhiko Kabashima, Kawasaki, JP;
Yoshihiro Takemae, Yokohama, JP;
Shigeki Nozaki, Kawasaki, JP;
Tsuyoshi Ohira, Kawasaki, JP;
Hatsuo Miyahara, Yokohama, JP;
Masakazu Kanai, Yokohama, JP;
Seiji Enomoto, Yokohama, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A semiconductor integrated circuit (IC) device includes therein a test circuit. The test circuit operates to distinguish the power source level during the testing or ground level occurring at an internal node located inside the semiconductor chip. The test circuit includes a series-connected MIS transistor and an MIS diode. The gate of the MIS transistor is connected to the internal node. The MIS diode is connected to an external input/output (I/O) pin. The level at the internal node, i.e., the power source level or the ground level, can be distinguished by a first voltage level or a second voltage level applied to the external I/O pin, whichever enables a current to be drawn from the external I/O pin.