The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 1985

Filed:

Nov. 23, 1982
Applicant:
Inventors:

Mario Bertero, Viale Benedetto, IT;

Edward R Pike, Malvern, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358 93 ; 378 71 ;
Abstract

An imaging system for obtaining information within the diffraction limit comprises an illuminating source of radiation, e.g. a laser. A lens system focuses radiation from a small area of an object onto a detector array in an image plane. The detectors measure the amplitude of the received radiation giving a matrix of information. This matrix is then inverted by a computer to reconstruct the image for observation on a cathode ray tube. The object is scanned by scanning the radiation or stepping the object.


Find Patent Forward Citations

Loading…