The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 1985
Filed:
Sep. 30, 1982
NCR Corporation, Dayton, OH (US);
Abstract
A method and system of matching first and second waveforms, each having identifiable features, for identification purposes. The method includes the steps of obtaining from the first waveforms significant said identifiable features having values and locations with respect to a starting point of the associated said first waveform, with the significant identifiable features being obtained according to the predetermined criteria; utilizing values and locations of the significant identifiable features of a first waveform to search in predetermined locations for anticipated corresponding identifiable features in a second waveform; determining the values and locations of the identifiable features, if any, found in the predetermined locations; and comparing the values and locations from the determining step with the values and locations of the significant identifiable features of a first waveform according to second predetermined criteria to determine whether or not the second waveform matches a first waveform. The system includes a data acquisition module for obtaining the significant identifiable features mentioned, and a matching module for utilizing the significant identifiable features of the first waveforms to effect the comparing step mentioned.