The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 1985
Filed:
Jul. 08, 1983
James B Tsui, Centerville, OH (US);
Rudy L Shaw, Huber Heights, OH (US);
Abstract
The instantaneous frequency measurement (IFM) receiver is highly susceptible to erroneously reporting frequency if two or more signals are overlapped in time. This problem is extremely important when the receiver is presented with synchronized signals. A method is presented to detect simultaneous signals which overlap in the critical frequency encode strobe. In essence, during the pulse overlap condition, a transient will occur on the video output lines of the receiver. These lines are monitored during the transient period and compared with predetermined values which are obtained from the single signal condition. If a transient is detected, a simultaneous signal detect flag is raised and this flag is sent to an associated processor. In this special design, the receiver will measure the frequency again at approximately 200 ns from the first measurement. The transient detection is also performed on the second measurement.