The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 1985

Filed:

Apr. 19, 1983
Applicant:
Inventors:

Hiroshi Sugimoto, Tochigi, JP;

Yujiro Naruse, Yokohama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ; H01L / ;
U.S. Cl.
CPC ...
250370 ; 2503272 ; 2503 / ;
Abstract

A two-dimensional X-ray detecting apparatus is comprised of an amorphous silicon layer for trapping electrons in a pattern corresponding to an intensity distribution when it is receiving X-rays, and a scanning device for scanning the surface of the amorphous silicon layer with a laser beam to take out electrons trapped in the silicon layer.


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