The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 1985
Filed:
Mar. 24, 1982
Applicant:
Inventors:
Takaharu Koike, Ina, JP;
Akio Taira, Hachiouji, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350514 ; 350286 ;
Abstract
A microscope optical system wherein a light is made to enter a beam splitter of a Jentzch type prism through another surface than the front surface of the beam splitter in order to form a Jentzch type binocular optical system to be small and simple and to be able to obtain a high quality object image.