The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 1985
Filed:
Feb. 09, 1983
Shinichiro Watanabe, Tokyo, JP;
Japan Spectroscopic Co., Ltd., Hachioji, JP;
Abstract
In a spectrophotometer of double beam type using automatic gain control, preparatory scanning is first carried out by scanning reference and sample cells with radiation of varying wavelengths both in an empty state, and controlling the gain of a photo detector at each wavelength such that a detector output responding to a sample cell transmitted beam may become constant while storing a detector output responding to a reference cell transmitted beam. Measurement of a sample material is then carried out at each wavelength by scanning the reference cell and the sample material-charged sample cell, reading out the reference output stored in the preparatory scanning stage as a reference voltage, and controlling the gain of the detector such that a detector output responding to a reference cell transmitted beam may be equal to the reference voltage.