The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 1985

Filed:

Apr. 08, 1983
Applicant:
Inventor:

Stanley B Smith, Jr, Westford, MA (US);

Assignee:

Allied Corporation, Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01J / ;
U.S. Cl.
CPC ...
356319 ; 356334 ; 356315 ;
Abstract

A chopperless spectroanalytical system of the double beam type in which radiation from a common source is split into reference and analysis beams. The two beams are directed along similar paths such that the analysis beam passes through an analysis region and the reference beam bypasses that analysis region. A monochromator has two spaced aperture regions such that one aperture region provides an entrance aperture for the analysis beam and an exit aperture for a dispersed portion of the reference beam; and the other aperture region provides an entrance aperture for the reference beam and an exit aperture for a dispersed portion of the analysis beam. The beams exiting from the two exit apertures are simultaneously monitored and compared to compensate for errors due to source fluctuations and the like.


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