The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 1985
Filed:
Jun. 14, 1984
Toyohiko Kitada, Tokyo, JP;
Takanori Arioka, Tokyo, JP;
Kabushiki Kaisha Tokyo Keiki, Tokyo, JP;
Abstract
An ultrasonic thickness gauge including a split-type probe to perform the transmission-reception of ultrasonic waves via a material board to be measured, a zero point calibration circuit to delay the zero point by a specified delay time from the wave transmission timing, and a measuring circuit to count clock pulses for the duration from the zero point to the wave reception timing. This ultrasonic thickness gauge is characterized in that it also includes a counter to count, within specified range, the clock pulses relating to the board thickness in each previous measurement conducted by using the preset zero point, and a zero point adjusting circuit to vary the zero point of the zero point calibration circuit in proportion to the count value of the above-mentioned counter. In addition, a coefficient selecting circuit to shift the proportionality coefficient of the zero point adjusting circuit step by step in accordance with the board thickness obtained in each previous measurement may be included for measuring a wider range of board thickness.