The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 1985

Filed:

Apr. 11, 1983
Applicant:
Inventors:

Michiaki Miyagawa, Hachiooji, JP;

Kouichi Ohki, Tokyo, JP;

Matsuhiko Takaya, Hino, JP;

Naoto Fujihara, Hino, JP;

Tadayuki Yamada, Hino, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382 48 ; 340723 ;
Abstract

A pattern discriminator receives scanning data obtained by raster scanning objects within predefined window regions with a photoelectric converter, converts the scanned data into pixel binary data by using a threshold value dependent upon the scanning position and window region and evaluates the binary data in accordance with predetermined criteria to produce an output signal indicative of the evaluation. A memory stores data which represents the window regions in a compressed arrangement indicating the ordinate and abscissa coordinates of the beginning and ending points or pixels of each window region location on each scanning line, along with corresponding information representing the particular threshold value to be used for each window region segment on each scanning line.


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Miyagawa, Michiaki. (1985). Pattern discriminator (U.S. Patent No. 4545070). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4545070

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