The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 1985
Filed:
Mar. 19, 1984
Applicant:
Inventors:
Koichi Maeda, Tokyo, JP;
Haruo Ito, Tokyo, JP;
Assignee:
Hewlett-Packard Company, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 324 / ;
Abstract
A novel digitized measuring system is disclosed for the measurement of the DC parameters of a wide variety of electrical and electronic devices. A stimulus measuring unit (SMU) is disclosed which can alternatively act as a voltage source and current monitor or as a current source and voltage monitor. A device under test (DUT) can be characterized without changing external connections and the resulting data can be manipulated and displayed in a wide variety of graphical or tabular forms.