The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 1985

Filed:

Jan. 10, 1983
Applicant:
Inventors:

Raymond A Ergas, Laguna Beach, CA (US);

Francis Muir, Laguna Niguel, CA (US);

Assignee:

Chevron Research Company, San Francisco, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ; G01V / ;
U.S. Cl.
CPC ...
364421 ; 367 20 ; 367 21 ; 367 39 ; 367100 ;
Abstract

A method is disclosed for determining if sign-clipped variations of full-waveform traces can be used in subsequent cross-correlation processing without undue hardship. In accordance with one aspect, the present invention examines skewness of the amplitude spectrum of the full waveform. If the former significantly differs from conventional Gaussian distribution over the frequency range of interest, i.e., the amplitude spectrum is non-Gaussian, sign-clipped versions thereof can be used in subsequent cross-correlation processing without undue loss in processing accuracy. In another aspect, the present invention is used to edit a series of traces, one at a time, gathered by a large multichannel collection system. In this aspect, the different spectral noise estimates, including cross-correlation estimates generated from sign-clipped versions of the full-waveform traces, are advantageously used.


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