The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 1985
Filed:
Apr. 02, 1984
Peter Cawley, London, GB;
Robert D Adams, Bristol, GB;
National Research Development Corporation, London, GB;
Abstract
Apparatus and method for testing structures by impact. The structure is struck by an impactor associated with a force transducer the output of which is related to the force which the transducer experiences on impact and encompasses a frequency range including the lowest frequencies (typically approaching zero frequency, see FIG. 3) which that force contains to any substantial degree. A test spectrum of the force including that full range of frequencies is produced by a Fourier transformer in a form suitable for automatic comparison, and is then so compared with a reference spectrum typical of impact with a reference structure, and a signal is produced indicating fit or lack of fit between the test and reference spectra.