The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 1985
Filed:
Sep. 10, 1982
Bonnie L Zimmerman, Greenhill Farms, PA (US);
Thomas W Gannaway, Overbrook Hills, PA (US);
Lawrence J Resinski, Hatboro, PA (US);
Philip S DeVita, Richboro, PA (US);
Jewish Employment and Vocational Service, Philadelphia, PA (US);
Abstract
A multiple aptitude testing device for electronically evaluating an examinee's capacity or aptitude toward performing various vocational tasks. The device includes a test station which affords five general types of examinations, namely, objective question and answer tests, a manual dexterity test, a finger dexterity test, a hand/eye coordination test, and a hand/eye/foot coordination test. The question and answer examinations entail interchangable overlays which contain questions and possible answers such that the examinee selects what he deems is the correct answer by contacting an appropriate sensor on the housing with an electrically conductive answer probe. The other four examinations entail counters for electronically measuring the number of times the examinee is able to perform a manipulative task during a fixed period of time. The device provides an electronic comparator for automatically grading the examinations and displaying or printing a test score associated with each of said tests. The device 20 is further designed to generally recognize which test is being conducted based on which of the various attachments or overlays are connected to the device. Although the test station is generally self-contained, e.g., not requiring separate answer booklets, writing utensils, etc., the preferred embodiment of the device entails using a separate master control unit which enables simultaneous, synchronized control of up to four test stations.