The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 1985
Filed:
Jan. 19, 1983
Applicant:
Inventors:
Wolf D Seufert, Sherbrooke, Quebec, CA;
Roger A Cote, Sherbrooke, Quebec, CA;
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382-4 ; 356374 ; 2502 / ;
Abstract
The disclosure herein describes an apparatus and a method of analysis of line patterns such as fingerprints, ideograms, or the like, which comprises the steps of superimposing a centrosymmetric reference pattern of lines over the line pattern to be analyzed to form an interferometric pattern of the moire type, positioning the reference pattern on a characteristic element of the line pattern to be analyzed, and enlarging it until the lines of the reference pattern fill the space between adjacent lines closest to the characteristic element to thereby translate the superimposed line patterns into a field pattern of different optical densities.