The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 1985

Filed:

Jul. 12, 1983
Applicant:
Inventors:

Ingmar Feigt, Erlangen, DE;

Wolfram Wersing, Kirchheim, DE;

Assignee:

Siemens Aktiengesellschaft, Berlin & Munich, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358295 ; 378 28 ;
Abstract

An apparatus for contact-free measurement of electrical charge images of the type generated on a storage plate as transmission images by means of electro-radiographic recording methods has a matrix of dynamically functioning probes, such as Kelvin probes, for scanning the effect of the electrostatic induction caused by the image on the storage plate, the outputs of the probes being amplified and supplied to a display device such as a picture screen. The individual probes of the matrix are electrically conductive elements and a mechanical oscillation is generated between the charge image and the probes in the field to be measured either by oscillating the probes or by oscillating the storage plate. The charge amounts electrostatically induced in the probes are tapped as the image signals.


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