The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 1985
Filed:
Mar. 24, 1982
Asao Hayashi, Hachioji, JP;
Masahiro Aoki, Fussa, JP;
Kenichi Oinoue, Tokyo, JP;
Masatoshi Ida, Hachioji, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A method of detecting focusing conditions used for optical machinery is disclosed. The focusing conditions of an optical image projected onto photodetector arrays arranged on both sides of the focal plane with a certain optical distance are detected based on an evaluation function representing a sum of absolute values of differences between output signals of adjacent photodetectors. When a value of a first evaluation function represented by the largest absolute value is less than a predetermined threshold a second evaluation function represented by a sum of the maximum and next largest absolute values is used thereby detecting the focusing conditions for a graded image.