The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 1985

Filed:

Mar. 05, 1984
Applicant:
Inventor:

William A Conner, Plano, TX (US);

Assignee:

Rockwell International Corporation, El Segundo, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B / ;
U.S. Cl.
CPC ...
455 67 ; 455 47 ; 324 / ;
Abstract

A method for measuring oscillator spillover noise produced by a single sideband microwave radio is provided. A white noise signal filtered by a narrow notch filter having a bandwidth on the order of the spillover bandwidth is applied as a modulating input. The white noise signal filtered by wide notch filter is also applied as a modulating input. After demodulation, noise measurements are made in the narrow and wide notches. Because the wide notch contains practically no oscillator spillover noise near its center, the noise measured there can be subtracted from that measured in the narrow notch to provide a figure for the oscillator spillover noise. Idle noise can be subtracted from the wide notch noise value to provide a measure of intermodulation distortion.


Find Patent Forward Citations

Conner, William. (1985). Measurement of oscillator spillover noise in a single sideband system (U.S. Patent No. 4539709). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4539709

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…