The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 1985
Filed:
Dec. 23, 1981
Applicant:
Inventor:
Mark E Faulhaber, Wilmington, DE (US);
Assignee:
E. I. Du Pont de Nemours and Company, Wilmington, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356431 ; 250563 ;
Abstract
An inspection system of the type having a rotating multifaceted mirror and a radiation collecting arrangement is characterized by a network in which the signal representative of the web being inspected is compensated for deviations superimposed on that signal due to variations in the reflectivity among the various mirror facets and normalized for variations in the optical efficiency of the radiation collecting arrangement.