The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 1985
Filed:
Nov. 29, 1979
Erik W Anthon, Santa Rosa, CA (US);
Optical Coating Laboratory, Inc., Santa Rosa, CA (US);
Abstract
Flatness testing apparatus for testing the flatness of a surface of a body of material a source of substantially monochromatic light for producing a light beam. First and second reticles are provided which are capable of passing the light beam. Means is provided for sensing light from the light source after it has passed through the reticles. An objective lens is provided which is adapted to be disposed adjacent the surface of the body of material. A first lens is provided in front of the source of light for imaging the source of light onto the objective lens and a second lens is provided in front of the means for sensing light for imaging the objective lens onto the means for sensing light. A mirror is provided for receiving light from the light beam after it has passed through the first reticle and for reflecting light through the second reticle to the light sensing means. Means is provided for causing relative movement of the reticle images with respect to each other to cause modulation of the light beam in accordance with the flatness of the surface.