The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 1985
Filed:
Jan. 13, 1983
Erich Heynacher, Heidenheim, DE;
Reinhard Ludewig, Heidenheim, DE;
Carl-Zeiss-Stiftung, Heidenheim, DE;
Abstract
The invention relates to a three-dimensional length-measuring device which employs optical interferometry and in which the comparator principle is satisfied as excellently as possible with respect to all three axes. For this purpose, a workpiece holder which is displaceable in orthogonal horizontal directions carries a three-dimensional reflecting body which defines a measurement space and is in the form of three mutually perpendicular adjacent mirrors (triple mirrors). Extensions of measurement beams with which the three-dimensional reflecting body is measured intersect at a point only slightly offset from the workpiece holder, and to obtain high thermal stability, the measurement table and the housing of the measuring device are made of a material of low thermal expansion. In order to determine each coordinate of the position of a movable probe pin with interferometric precision of measurement, a first one of the individual beams of a double-beam flat-mirror interferometer is provided for each coordinate and is directed via a triple prism fixed with respect to the probe-pin holder. The other individual beam of the interferometer is in each case used to directly measure the opposing mirror of the three-dimensional body connected with the workpiece. Interferometer heads themselves are fixedly mounted on the machine. The probe-pin holder which in terms of the optical system need only carry the triple prisms, therefore is of very low weight.