The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 1985
Filed:
Mar. 10, 1982
Leonard E Kronfeld, Minneapolis, MN (US);
Nortronics Company, Inc., Minneapolis, MN (US);
Abstract
An optical inspection system includes a thin optical probe having spaced parallel viewing surfaces on opposite sides and image reflecting elements within for transmitting images from the viewing surfaces to viewing optics including optical paths aligned with the edge of the probe to receive and magnify images from the viewing surfaces. The apparatus permits insertion of the probe for inspection and measurement of areas not readily accessible by conventional means. The probe is preferably used as part of a system and method for optical alignment verification of double sided floppy disk transducer head assemblies, wherein the probe is inserted between the heads, with their read/write gaps adjacent the viewing surfaces. Measurement apparatus is provided to permit measurement of the relative positions of the read/write gaps for the two heads. An optical tracking scope is provided for measuring any movements of a transducer mounted on a lift arm of a transducer assembly that are caused by lifting the arm wider than normal operating position to accept the thickness of the optic probe. The induced movements can then be compensated for in the calculation of head alignment.