The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 1985
Filed:
Aug. 12, 1983
Applicant:
Inventor:
Paul J Sokolovsky, Sunnyvale, CA (US);
Assignee:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73-7 ;
Abstract
An apparatus for quality control testing of semiconductor packages comprises a support platform for holding a device in a fixed location and a reciprocatable brush which is mounted to contact the device with a constant force. The reciprocating mechanism basically moves the brush horizontally across a test package but is linked with a cam system for elevating the brush out of contact with the test package during one of the strokes and lowering the brush back into contact with the test package during the other stroke. Highly accurate and repeatable abrasion tests can thus be performed.